Adhesion Force Measurement of Mica surface using AFM

Chetan Subedi, S K Lamichhane

Abstract

AFM is a tool to study the surface topography and associated molecular forces in real space image. AFM force-distance spectroscopy is the platform on which one can quantify atomic or molecular interactions and hence provide information that is critical to understand potential energy surface of mica through the measurement of pull-off force.

Keywords: AFM; Force distance curve; Nanoscale; Pull off force

The Himalayan Physics

Vol.2, No.2, May, 2011

Page: 71-72

Uploaded Date: 1 August, 2011

Keywords

AFM; Force distance curve; Nanoscale; Pull off force
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