PANT, A. D. Conventional to slow muon microscopy – a review. BIBECHANA, [S. l.], v. 17, p. 139–145, 2020. DOI: 10.3126/bibechana.v17i0.26867. Disponível em: https://www.nepjol.info/index.php/BIBECHANA/article/view/26867. Acesso em: 20 apr. 2024.