REGMI, D.; POUDEL, M. R.; K.C., B.; POUDEL, P. B. Yield Stability of Different Elite Wheat Lines under Drought and Irrigated Environments using AMMI and GGE Biplots. International Journal of Applied Sciences and Biotechnology, [S. l.], v. 9, n. 2, p. 98–106, 2021. DOI: 10.3126/ijasbt.v9i2.38018. Disponível em: Acesso em: 20 sep. 2021.