LAMICHHANE, S. Morphology and AFM Spectroscopy of Irradiated Interface of Silicon. Nepal Journal of Science and Technology, [S. l.], v. 14, n. 2, p. 155–160, 2014. DOI: 10.3126/njst.v14i2.10430. Disponível em: https://www.nepjol.info/index.php/NJST/article/view/10430. Acesso em: 14 jul. 2024.