Conventional to slow muon microscopy – a review

Authors

  • Amba Datt Pant Institute of Quantum Beam Science, Graduate School of Science and Engineering, Ibaraki University, 2-1-1 Bunkyo, Mito 310-8512

DOI:

https://doi.org/10.3126/bibechana.v17i0.26867

Keywords:

Muon, Muonium, muSR technique, Ultra-slow muon

Abstract

Because of special characteristics (fully spin polarized and asymmetric decay to positron), muon acts as sensitive probe to study the local electronic and dynamics of materials. The muon of energy MeV or high, conventional muon, are used to study bulk properties of the materials. For the study of nanoscience, slow muon (20 eV - 30 keV) muon with low energy spread are essential that leads to development of slow muon microscopy. Introduction to muon microscopy, application of conventional muons and need of slow muon beam along with future prospects are briefly discussed. 

BIBECHANA 17 (2020) 139-145

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Published

2020-01-01

How to Cite

Pant, A. D. (2020). Conventional to slow muon microscopy – a review. BIBECHANA, 17, 139–145. https://doi.org/10.3126/bibechana.v17i0.26867

Issue

Vol. 17 (2020)

Section

Review Articles

License

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